Postdocs on ultrafast soft-X-ray metrology and high-harmonic metrology

Work Activities
The at ARCNL, Amsterdam, has openings for two positions for postdoctoral researchers (2-year contracts).
Project 1:
You will contribute to some of our ongoing investigations to develop new ultrafast femtosecond to attosecond time-scale semiconductor spectroscopy, imaging and metrology techniques in the soft-X-ray spectral range based on a laboratory-based high-harmonic generation setup. This includes developing soft-X-ray spectroscopic scatterometry to measure nanoscale features of various multilayer semiconductor structures, and develop ultrafast metrology to characterize electrical contacts between different layers in a non-contact way. Your research will contribute to bringing the fundamental field of attosecond science in contact with industrial applications to measure nanoscale structures. Finally, you will use the developed techniques to study dynamics and phase transitions in strongly correlated materials.
Project 2:
In the second proje...